SL8600 Desktop wafer inspection lamp; Wafer dust particle defect inspection lamp

SL8600 Desktop wafer inspection lamp; Wafer dust particle defect inspection lamp

Product introduction

light Intensity: 300 000 lux at 30CM distance. (we master the core technology. We can offer different parallel lights to meet various demand.)

Additional Information:

Tel: (852) 6740 3030; 0086-755-82153693
Fax: 0086-755-82483923
E-mail: info@sunlonge.com, sunlonge@gmail.com

Desktop wafer inspection lamp, High illuminance LED inspection lamp. Wafer dust particle defect inspection lamp: High illuminance LED surface inspection lamp.

LCD screen surface inspection lamp.

SL8600 series are with yellow green light source inspection lamp(white light optional). The principle: The LED source will emit special wavelength light source through the refraction of optical lens. With the light on the surface of sample, the inspector can detect the dust, scratches, glitch, ink etc. It can take the place of traditional lighting device and optical system machine. The inspector can detect the defect and flaws directly of test sample by the light source and human eyes. It can help greatly save the purchase cost. The SL8900 is with 510-590NM light source, which is sensitive to human vision, with the green and yellow compound light source. The illuminance can reach up to 400 000lx, meanwhile the lifespan can reach up to 30 000H. It can detect the dust particles in the 1um size range, which is 10 time powerful than the traditional inspection lamp.( (Note: The main differences between SL8900 and SL8600 are:

The size of the SL8600 is small, the maximum brightness of the SL8600 is only 300,000 LX, and the maximum brightness of the SL8900 is 400,000 LX)

SL8600 Desktop wafer inspection lamp; Wafer dust particle defect inspection lamp

SPECIFICATIONS:

Model: SL8600-GY high illuminance LED inspection lamp. Wafer dust particle defect inspection lamps. Wafer surface inspection lamp.

Light source: 1PCS 20W imported LED with customized optical lens. Average 30 000H lifespan.

light  Intensity: 210 000 lux at 40CM distance; 300 000 lux at 30CM distance. (we master the core technology. We can offer different parallel lights to meet various demand.)

Irradiated area: Φ60~~160MM at 40CM distance(Dimming to adjust the area )

Dimming: infinite dimming, from 0% ~100%. Consumption: 20W.

Power supply: AC100-240V(input:AC100-240V/Output:DC 12V 2A) 24H continuous operation.

Stability of Led Lamp: > 90%

Product Size: 73*180MM. Net weight: 0.68Kg without accessory.

SL8600 Desktop wafer inspection lamp; Wafer dust particle defect inspection lamp

Model SL8600-W white light wafer inspection lamp SL8600-GY green yellow wafer inspection lamp Remark
LED NO and specification 1 pcs imported 20W 6000K LED with customized optical and filter system. We can customize

The lamp according to your demand.

6000K white light or 510-590NM green yellow light (365NM;455NM;595NM;625NM optional)
Wavelength 6000K white light 510-590NM green yellow light
 

Illuminance

21万LX→at 40cm distance;

30万LX→at 30cm distance;

 

20万LX→at 40cm distance

30万LX→at 30cm distance;

We master the core technology. We can offer different illuminance inspection lamps to meet different demand.
Irradiated area  

Ø 8- 16cm at 40cm distance

Dimming Infinite dimming, 0%~~100% by the modulator. Dimming the light to zoom in or out.
lifespan 30000H
Size and weight 73*180MM, Weight: 0.68Kg without accessories.
accessory protective glassed

SL8600 Desktop wafer inspection lamp; Wafer dust particle defect inspection lamp

Feature:

1. 1 pcs high power LED, cold light source, 300 000 lx high illuminance, compatible with 150W mercury-vapor light.

2. Lifespan up to 30 000H, 10 time longer than the mercury-vapor light.

3.The illuminance stability can be up to 90% with customized optical and filter system. Perform better than the lamps of Japanese and Germany lamps.

4. White light or green yellow light, sensitive but do not to harm the human vision. Detect the scratches and dust particles at the 10um size range.

5.Mechanical cooling. Provide stable and high illuminance special wavelength light source

You can choose different wavelength light source (365NM,455NM,525NM,595NM,625NM,6000K optional)

White light: effective for scratches, uniform coating of different levels, or contamination.

Green light: effective for slight scratches, dust particles on LCD screen. 70% of defect can be detected.

Yellow light: effective for micro engraving mold, semiconductor, wafer and coating.

SL8600 Desktop wafer inspection lamp; Wafer dust particle defect inspection lamp

Send Message to us

请在浏览器中启用JavaScript来完成此表单。