Surface Inspection Lamp
Sunlonge semiconductor semi-automatic inspection device, consists of the three-axis automatic automatic adjustment device SLT600(three-axis manual/electric rotary table+controller) and the wafer inspection lamp(generally with SL8500-GY).
SL8900 wafer inspection lamp, Wafer dust particle defect inspection lamp,The illuminance can reach up to 160 000lx
SL8100 wafer inspection lamp, Wafer dust particle defect inspection lamp,The illuminance can reach up to 350 000lx
light Intensity: 150 000 lux at 30CM distance. (we master the core technology. We can offer different parallel lights to meet various demand.
light Intensity: 300 000 lux at 30CM distance. (we master the core technology. We can offer different parallel lights to meet various demand.)
light Intensity: 400 000 lux at 30CM distance. (we master the core technology. We can offer different parallel lights to meet various demand.)
SL8806-GY Green surface inspection Lamp，Wafer Inspection Lamp isincluding two wavelength combination,
SL8904-GW hand held multi-wavelength inspection lamp is with 6 LED built in, including two wavelength combination
Green surface inspection Lamp with white side light. Surface Inspection Lamp use 4 pcs 5W 525 NM LED with lens and white side light, average LED life is 30,000 hours.
SL8800desktop surface inspection lamp (Sodium lamp) manual
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