Sunlonge semiconductor semi-automatic inspection device, consists of the three-axis automatic automatic adjustment device SLT600(three-axis manual/electric rotary table+controller) and the wafer inspection lamp(generally with SL8500-GY).
SL1200 UV LED light is with 3W SVC 365NM UV LED light source. Compact design and powered by 3PCS AAA battery. The UV intensity of SL1200 can be up to 48000 uw/cm2 at 38cm distance
SL1000 UV LED light is with 3W SVC 365NM UV LED light source. Lifespan up to 30000H. Compact design and powered by 1PCS AA or 2 PCS AA battery. The UV intensity of SL1000 can be up to 36000 uw/cm2 at 38cm distance
SL8900 wafer inspection lamp, Wafer dust particle defect inspection lamp,The illuminance can reach up to 160 000lx
SL8100 wafer inspection lamp, Wafer dust particle defect inspection lamp,The illuminance can reach up to 350 000lx
light Intensity: 150 000 lux at 30CM distance. (we master the core technology. We can offer different parallel lights to meet various demand.
light Intensity: 300 000 lux at 30CM distance. (we master the core technology. We can offer different parallel lights to meet various demand.)
light Intensity: 400 000 lux at 30CM distance. (we master the core technology. We can offer different parallel lights to meet various demand.)
Microscope light source SLM301dual gooseneck led point light source for stereo microscope
Microscope light source,Light Microscope
Fluorescent Leak Detection Lamp: 3 x 5W 365NM UV LED with lens,UV Intensity:21000 UW/cm2
SL8806-GY Green surface inspection Lamp，Wafer Inspection Lamp isincluding two wavelength combination,
SL8904-GW hand held multi-wavelength inspection lamp is with 6 LED built in, including two wavelength combination
SL8906-UB inspection lamp is with 6 pcs powerful LED, with 2 different wavelength combination,3 pcs 365NM green light, 3 pcs 455NM blue ligh
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