SL8900 Desktop wafer inspection lamp, SL8900 High illuminance LED inspection lamp. Wafer dust particle defect inspection lamp

SL8900 Desktop wafer inspection lamp, SL8900 High illuminance LED inspection lamp. Wafer dust particle defect inspection lamp

Product introduction:

light Intensity: 400 000 lux at 30CM distance. (we master the core technology. We can offer different parallel lights to meet various demand.)

Additional Information:

Tel: (852) 6740 3030; 0086-755-82153693
Fax: 0086-755-82483923
E-mail: info@sunlonge.com, sunlonge@gmail.com

Desktop wafer inspection lamp, High illuminance LED inspection lamp. Wafer dust particle defect inspection lamp: High illuminance LED surface inspection lamp. LCD screen surface inspection lamp.

SL8900 series are with yellow green light source inspection lamp(white light optional). The principle: The LED source will emit special wavelength light source through the refraction of optical lens. With the light on the surface of sample, the inspector can detect the dust, scratches, glitch, ink etc. It can take the place of traditional lighting device and optical system machine. The inspector can detect the defect and flaws directly of test sample by the light source and human eyes. It can help greatly save the purchase cost. The SL8900 is with 510-590NM light source, which is sensitive to human vision, with the green and yellow compound light source. The illuminance can reach up to 400 000lx, meanwhile the lifespan can reach up to 30 000H.  It can detect the dust particles in the 10um size range, which is 10 time powerful than the traditional inspection lamp.

SL8900 Desktop wafer inspection lamp, SL8900 High illuminance LED inspection lamp. Wafer dust particle defect inspection lamp

 SPECIFICATIONS

 Model: SL8900-GY high illuminance LED inspection lamp. Wafer dust particle defect inspection lamps. Wafer surface inspection lamp.

Light source: 1PCS 30W imported LED with customized optical lens.  Average 30 000H lifespan.

light  Intensity: 280 000 lux at 40CM distance; 400 000 lux at 30CM distance. (we master the core technology. We can offer different parallel lights to meet various demand.)

Irradiated area: Φ90~~200MM at 40CM distance(Dimming to adjust the area )

Dimming: infinite dimming, from 0% ~100%. Consumption: 30W.

Power supply: AC100-240V(input:AC100-240V/Output:DC 12V 2A) 24H continuous operation.

Stability of Led Lamp: > 90%

Product Size: 86*200MM. Net weight: 1.18Kg without accessory.

Size: 86*200MM. Net weight: 1.18Kg without accessory.

 SL8900 Desktop wafer inspection lamp, SL8900 High illuminance LED inspection lamp. Wafer dust particle defect inspection lamp

Model

SL8900-W white light wafer inspection   lamp

SL8900-GY green yellow wafer   inspection lamp

Remark

LED NO and specification

1 pcs imported 30W 6000K LED   with customized optical and filter system.

We can customize

The lamp according to your demand.

6000K   white light or 510-590NM green yellow light (365NM;455NM;595NM;625NM optional)

Wavelength

6000K   white light

510-590NM   green yellow light

 

Illuminance

280000LXat   40cm distance

400000LXat   30cm distance

 

290000LXat   40cm distance

400000LXat   30cm distance

We   master the core technology. We can offer different illuminance inspection   lamps to meet different demand.

Irradiated   area

 

Ø 9-   20cm at 40cm distance

Dimming

Infinite   dimming, 0%~~100% by the modulator. Dimming the light to zoom in or out.

lifespan

30000H

Size   and weight

86*200MM,   Weight: 1.18Kg without accessories.

accessory

protective   glassed

 SL8900 Desktop wafer inspection lamp, SL8900 High illuminance LED inspection lamp. Wafer dust particle defect inspection lamp

Feature:

1. 1 pcs high power LED, cold light source, 400 000 lx high illuminance, compatible with 200W mercury-vapor light.

2. Lifespan up to 30 000H, 10 time longer than the mercury-vapor light.

3.The illuminance stability can be up to 90% with customized optical and filter system. Perform better than the lamps of Japanese and Germany lamps.

 4. White light or green yellow light, sensitive but do not to harm the human vision. Detect the scratches and dust particles at the 10um size range.

 5.Mechanical cooling. Provide stable and high illuminance special wavelength light source.

 6.You can choose different wavelength light source (365NM,455NM,525NM,595NM,625NM,6000K optional)

White light: effective for scratches, uniform coating of different levels, or contamination.

 Green light: effective for slight scratches, dust particles on LCD screen. 70% of defect can be detected.

 Yellow light: effective for micro engraving mold, semiconductor, wafer and coating.

SL8900 Desktop wafer inspection lamp, SL8900 High illuminance LED inspection lamp. Wafer dust particle defect inspection lamp

 Application:

 LCD screen, micro engraving mold, semiconductor, wafer, sapphire

 SL-8900XX   SL8900 series Lamp Abbreviation and code:

365NM ultraviolet Abbreviation–U        395NM violet Abbreviation—V

 455NM blue light Abbreviation–B         525NM green light Abbreviation–G

 595NM amber light Abbreviation–A        625NM red light Abbreviation-R

 6000k white light Abbreviation–W         510-590NM green yellow light abbreviation-GY

 SL8900BL: DC model with lithium battery pack (contact us for further information)

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